1st China RFID Benchmarking Test Forum & MOU Signing Ceremony

Background

The 1st China RFID Benchmarking Test Forum & MOU Signing Ceremony will be held on 1st March 2008 at the Hong Kong University of Science and Technology (HKUST). Organized by the Department of Computer Science and Engineering at HKUST, and supported by the LSCM R&D Centre, the event comprises three main parts: a MOU Signing Ceremony and featured/keynote speeches in the morning, followed by a selection of technology presentations in the afternoon. The MOU Signing Ceremony signifies the forming of the Consortium in which major RFID organizations in Mainland China and Hong Kong are joined together to advance the level of RFID benchmarking tests and standards.

Many leaders and talents from the RFID industry will be joining the event to share their insights. With "Outlook of RFID Benchmarking Tests and Standards in China" being the main theme of this Forum, the event aims to provide a platform for fellows from the RFID industry to share ideas and learn from each other.